Gilmour, N.; Alépée, N.; Hoffmann, S.; Kern, P.; Van Vliet, E.; Bury, D.; Miyazawa, M.; Nishida, H. .; Cosmetics Europe. Applying a Next Generation Risk Assessment Framework for Skin Sensitisation to Inconsistent New Approach Methodology Information. ALTEX 2023, 40, 439-451.